PP-SPM:
The probe particle model ( PP-SPM ) is a home-built simulation package, which enables to simulate scanning probe images with special aims to the high-resolution imaging with functionalized tips. The probe particle model has played an essential role in detailed understanding of the sub-molecular AFM/STM/IETS contrast which enables the unprecedented spatial resolution of moleculas and nanostructures on surfaces. There are several implementations of probe particle model using different levels of complexity
- Light module allowing simple but fast AFM simulations through web interface
- Full probe particle package allowing complex AFM/STM/IETS simulations placed on Github
Details about the probe particle model can be found here:
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Original paper describing principles of the probe particle AFM/STM
P. Hapala, G. Kichin, Ch. Wagner, F. S. Tautz, R. Temirov, P. Jelínek
Mechanism of high-resolution STM/AFM imaging with functionalized tips
Phys. Rev. B 90 (2014) 085421(1) - 085421(9). -
Importance of the electrostatic force and the mechanism of the submolecular IETS signal
P. Hapala, R. Temirov, F. S. Tautz, P. Jelínek
Origin of High-Resolution IETS-STM Images of Organic Molecules with Functionalized Tips
Phys. Rev. Lett. 113 (2014) 226101(1) - 226101(5). -
Advanced probe particle STM model
O. Krejčí, P. Hapala, M. Ondráček, P. Jelínek
Principles and simulations of high-resolution STM imaging with a flexible tip apex
Phys. Rev. B 95 (2017) 045407(1) - 045407(9). -
Advanced probe particle IETS model
Bruno de la Torre, Martin Švec, Giuseppe Foti, Ondřej Krejčí, Prokop Hapala, Aran Garcia-Lekue, Thomas Frederiksen, Radek Zbořil, Andres Arnau, Héctor Vázquez, and Pavel Jelínek
Submolecular Resolution by Variation of the Inelastic Electron Tunneling Spectroscopy Amplitude and its Relation to the AFM/STM Signal
Phys. Rev. Lett. 119 (2017) 166001(1) - 166001(6). -
Review about the sub molecular SPM imaging with functionalized tips
P. Jelínek
High resolution SPM imaging of organic molecules with functionalized tips
J. Phys.-Condens. Mat. 29 (2017) 343002(1) - 343002(18).