LT UHV JT- AFM / SPM

SPECS Low-temperature Scanning Probe Microscope with Joule-Thomson stage and magnetic field

- temperature 1.4K

- magnetic field up to 3 Tesla in Z direction

- based on Kolibri sensor

- Low Energy Electron Diffraction

- Nanonis controller

LT UHV - AFM / SPM

Createc low-temperature scanning probe microscope

- upgraded for simultaneous STM/AFM operation (for Qplus sensors)

- Nanonis controller

- RF wiring

- equipped with lenses

- Low Energy Electron Diffraction

VT UHV - STM

Omicron variable-temperature scanning tunnelling microscope

- standard instrument for testing sample preparation

- Low Energy Electron Diffraction